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Bitmapping one of the most complicated and data intensive process
steps in the the semiconductor fab. Scrambling of address lines,
quantity of bits per die, quantity of die per wafer, and now a larger
selection of products with embedded memory have demanded much effort
from the test and yield engineers responsible for those memory products.
iFAB-Bit simplifies the organization and translation of the masses
of data coming from the testers with innovative techniques.
iFAB-Bit utilizes the iFAB plug-in architecture to handle the placement
of bits within a die and the scrambling of addresses from test vectors
to physical row and columns to physical positions. iFAB plug-ins
employ an intuitive Application Programming Interface (API) and
Java Beans which are easily developed in the field by customers
or by Zenpire Consulting.
A device plug-in is compiled Java code; however unlike C+++ modules,
Java code is well supported with free development tools that provide
editors and debuggers for most operating systems (Windows 95, 98,
NT; Solaris; HP-UX, and Apple). iFAB-Bit also has tools to debug
the scrambling and positioning logic of the plug-in. Since most
memory devices are based on previous products, creating a new plug-in
is as simple a copying a one plug-in Java class, changing the quantity
of row or columns, and recompiling using a free Java compiler. Because
Java plug-ins are code rather than lookup tables, conversions are
quick and require little memory.
Bit failure classification analysis also uses a series of iFAB
plug-ins. The iFAB-Bit module can load in a series of classification
beans and provide them with parameters (such as test name, row count,
column count, block name). Output of classifications (such as row
or column failure, single bit failure, vertical bit pair failure)
can be sent to a flat text file or a defect file (KLARF) for loading
into a yield analysis system. Additionally, iFAB-Bit can save the
bit failures of a die to a GDS-II layer file for import and overlay
within a CAD tool.
iFAB-Bit functions as bitmap viewing and data validation software.
iFAB-Bit can load data directly from the tester (providing that
a custom plug-in has been created for that file format), translate
the addresses, perform failure classifications, and save the failures
with their physical locations to a file. As a viewer, iFAB-Bit borrows
technology from the iFAB-Defect
module to handle the wafer map displays including measuring distances
between bits, and magnification of displays. Combined with iFAB-Central,
this process can be attached to a loader which can move files to
any directory on the site's network and into the iFAB database.
Combined with iFAB-FA, iFAB
provides failed bit locations used to position a microscope to.
iFAB-Bit is not yet released, contact
Zenpire Sales for availability.
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- Runs on all major platforms
- Similar interface to all other iFAB modules (Defect, Setup,
FA, Test)
- Easy to use interface (engineers AND operators can use)
- Uses Java Beans as plug-ins to simplify the device setup process,
since Java development tools are free, lowers cost of product
introduction
- Uses Java Bean as plug-ins to provide modularity to the bit
failure classification process
- Saves raw bit map data as standard Windows bitmap image files
for easy editing and storage (1 bit, 8 bit, 24 bit color depth
- where each bit represents the results of one bit map test.
- Classified failures can be exported to defect files (KLARF,
TFF) for loading into a third party yield analysis system. (overlay
failed bits to defects)
- Classified failures can be exported to design files (GDS-II)
for importing into a CAD tool (overlay failed bits to product
layout)
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